A three-year research project has resulted in discovery of a new way to both measure and track the mechanisms causing voltage loss in electrical devices. Fulton Schools Associate Professor Zachary Holman and Assistant Research Professor Arthur Onno, who led the project, were on the team investigating the causes of voltage loss in cadmium selenide telluride thin films. The findings published in the research journal Nature Energy offer a way to achieve higher efficiencies in the performance of technologies and materials, including silicon and perovskites, that have industrial applications. Zachary says the group has already replicated the measurement technique to enable it to be used by two manufacturers of solar energy cells and modules.