Chip-Integrated Metasurface-Based Full-Stokes Polarimetric Imaging Sensors
A research group led by Yu Yao, a professor in the School of Electrical, Computer and Energy Engineering, part of the Fulton Schools, and her collaborators developed a chip-integrated metasurface-based Full-Stokes polarimetric imaging sensors that surpass conventional imaging sensing technologies. Traditional polarimetric imaging systems have required complicated optical components and moving parts to achieve comparably sharp and accurate imaging. Researchers say applications of advanced imaging sensors could improve autonomous vision, industrial inspection, space exploration, biomedical imaging and other sensing and imaging capabilities valuable to society.